The reality of DFT for large and complex SoCs has introduced new risk into design schedules. DFT teams end up in the critical path to tape out while waiting for portions of the design to be complete, ...
Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ...
Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex integrated ...
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